Electron Microscopy and Characterisation
Within IRIS and via the wider Faculty of Engineering and Industrial Sciences facilities we have access to a wide range of characterization tools supporting applications as diverse as nanotechnology, biotechnology, surface science, metallurgy, materials, failure analysis and micro devices. We support both the research and teaching communities within the University, external research institutions and local industries.
Key Capabilities
SEM
The Scanning Electron Microscope Unit was established at IRIS through Australian Research Council LIEF funding. The ZEISS Supra 40 VP Field Emission Scanning Electron Microscope provides high-resolution and excellent imaging particularly of nanotechnology and biotechnology samples. The microscope, incorporated with an energy dispersive X-ray spectrometer unit, provides X-ray line scan, X-ray mapping and quantitative X-ray analysis capabilities.
AFM/SPM
The NT-MDT Solver P7LS Scanning Probe Microscope provides a capability for atomic force microscopy and magnetic force microscopy to image the surface morphology and magnetic microstructure, and to quantitatively measure and analyze the surface roughness of various surfaces on the nanometer scale.
Biological and chemical characterization
We have a range of different capabilities for the biological and chemical characterization of materials. These include, contact angle goniometry, quartz crystal microbalance (QCM-D), gel electrophoresis, confocal and fluorescence microscopy and expertise in the development of biochemical assays including ELISA.
Current Activities
- Characterisation of thermal sprayed coatings.
- Design and fabrication of nanostructures.
- Development of smart materials for protective armour.
- Preparation and characterisation of nano magnetic thin films for atom optics.
- Consulting work involving materials preparation and characterisation techniques.
Research Team
